Features
- Non-contact, non-destructive measurement of metalic thin film thickness can be carried out directly on production wafers
- ULVAC's automatic calibration method removes the influence of measurement drift and vastly improves the repeatability of thickness measurement.
- Thickness of any metal or alloy can be measured with a user generated material property database.
Need more information?
At ULVAC, we understand that finding the right product is crucial for optimizing your processes, whether you're scaling up production or maintaining precision in your systems. With our wide range of cutting-edge vacuum technologies and in-depth expertise, we will guide you through selecting the ideal solution tailored to your unique requirements.
Contact ULVAC Component Sales & Support For inquiries outside North and South America, please contact ULVAC Corporate
