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   ULVAC Technologies, Inc.
   401 Griffin Brook Drive
   Methuen, MA 01844

   Tel: 978-686-7550
   Fax: 978-689-6300


 Etching 

MEMS & MOEMS & Photonics

NLD-6000 provides superior solutions for processes from mask deposition through mask material etching and quartz etching.

Features

  • The etching system uses plasma with low pressure (0.2 to 1 Pa), high density (Ne (Ar) : 1 to 5 x 1011 cm-3) and low electron temperature (Te : 2 to 3 eV).
  • By adjusting weak coil magnetic field that forms the magnetic neutral beam, it enables to change the plasma spatial distribution for controlling uniformity. ULVAC's NLD etching systems are the only commercially available systems to provide this feature.
  • Using lower pressure than other etching systems (which use pressure of 2 to 45 Pa), it enables etching with low radical density, and especially ideal for organic low-K etching, quartz deep etching and high-K material etching.
  • Low-pressure etching enables low dust creation, and smooth bottom and side surfaces.

Specifications

SiO2processing performance : ±1ºor less
Depth: 10 to 50µm
High-speed processing : > 500 nm/min
Substrate size : Up to 200 mm
Etching uniformity in substrate: 1%
Dimensional control : 1/10 mask size or less


For more information
Please Email Us
TEL : 978-686-7550/ FAX : 978-689-6300

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